Simulation Study of Magnetic Memory Signal Correlation Effect of Dual Defects by ANSYS

Abstract:

To study the correlation effect of multiple defects of metal magnetic memory (MMM) testing technology, the stress-magnetization effect on 20# steel specimen with dual defects under exercise of the geomagnetic field and tensile load is simulated by using the finite element analysis (FEA) software ANSYS. With the stimulation, the magnetic flux leakage (MFL) distribution with different measured paths and different lift-off values of the surface specimen is given. The results showed that the correlation effect of dual defects produce more severe stress concentration phenomenon on the associated region of ferromagnetic specimen, and had no obvious effect on the edge of ferromagnetic materials; Gradient value K of the normal component H(z) of leakage magnetic field in the specimen, as a parameter evaluation of stress concentration in the specimen, has high reliability in areas without correlation effect, but it has no credibility in areas under dual defect correlation effect. Moreover, this article also discusses the influence of measured path and the lift-off value on magnetic memory signals.

• Periodical: Advanced Materials Research (Volumes 989-994)
• Pages: 3189-3194
• DOI: https://doi.org/10.4028/www.scientific.net/AMR.989-994.3189
• Online since: July 2014
• Authors: Xiao Wen Xi*, Shang Kun Ren, Ya Fan Zhang, Yin Huang
• Keywords: ANSYS Simulation, Correlation Effect, Magnetic Memory Testing, Stress Concentration

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