Structural and Dielectric Properties of Calcium Bismuth Titanate (CaBi₄Ti₄O₁₅) Ceramics

Abstract:

Calcium Bismuth Titanate (CaBi₄Ti₄O₁₅) ceramics were prepared by conventional solid-state reaction method. X-ray diffraction patterns confirms the orthorhombic structure of CaBi₄Ti₄O₁₅ and the lattice parameters were also determined. Bulk densities of the sintered ceramics were measured by the Archimedes method with xylene as the liquid media and found to be 97~98% of X-ray density. The surface morphology of CaBi₄Ti₄O₁₅ is studied by Scanning Electron Microscope (SEM) attached with energy dispersive X-ray spectroscopy (EDS) inorder to determine the grain size as well as the chemical composition of CaBi₄Ti₄O₁₅. The dielectric constant (k) and dielectric tangent loss (tan δ) of CaBi₄Ti₄O₁₅ as a function of temperature were measured in the frequency range of 100 Hz-100 KHz. The dielectric constant, dielectric loss and ac conductivity of CaBi₄Ti₄O₁₅ increases gradually with an increase in the temperature from 303 to 573 K. The ac conductivity of the prepared sample reveals that the conduction mechanism is electronic hoping

• Periodical: Advances in Science and Technology (Volume 106)
• Pages: 54-59
• DOI: https://doi.org/10.4028/www.scientific.net/AST.106.54
• Online since: May 2021
• Authors: Hymavathi Basireddy*, Gopal Reddy Thukkaraju, Rajesh Kumar Borra, Subba Rao Thota
• Keywords: AC Conductivity, Bismuth Layered Compound, Dielectric Properties, Solid State Reaction Method

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