Artificial structures with sub-optical wavelength features are engineered to feature non-conventional values for material properties such as optical and infrared permeability and permittivity. Such artificial structures are referred to as optical and infrared metamaterials. The application space of electromagnetic metamaterials includes novel sub-wavelength waveguides and antennas, true time delay devices, optical filters, and plasmonic electronic-optical interfaces. In this paper presents an optical diagnostic technique adapted for measuring and analyzing bidirectional polarimetric scatter from novel photonic and infrared metamaterials of interest. This optical diagnostic technique is also broadly applicable to other optical/infrared metamaterial structures that are proposed or developed in the future. The specific project goals are a) Demonstrate a novel metamaterial characterization full-polarimetric diffuse ellipsometry technique suitable to measure desired material properties with stated uncertainty limits for novel photonic and infrared metamaterials of interest. b) Demonstrate incorporation of predictive computational codes that estimate the electro-magnetic property values for metamaterial designs and concepts of interest.