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Abstracts
Resonant Diffusion of Molecules in Solids
a.477
Numerical Technique for Coupled Surface and Grain-Boundary Diffusion
a.478
The Theory of the Enhancement Factors of Solute Diffusion in Dilute Body-Centered Cubic Solid Solutions
a.479
Pre-Roughening, Diffusion and Growth on a Face-Centered Cubic (111) Surface
a.480
Electromigration, Simulation of Electromigration in Thin-Film Diffusion Barriers by the Transmission Line Matrix Method
a.481
Stress Distribution and Mass Transport along Grain Boundaries during Steady-State Electromigration
a.482
Point Defects, Thermodynamics of Vacancy Formation in Face-Centered Cubic Metals
a.483
Extended Vacancy-Vacancy Liquid Model
a.484
Trapping of Point Defects in Alloys due to Short-Range Order
a.485
HomeDefect and Diffusion ForumDefect and Diffusion Forum Vols. 127-128Electromigration, Simulation of Electromigration...

Electromigration, Simulation of Electromigration in Thin-Film Diffusion Barriers by the Transmission Line Matrix Method

Page: A481

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