Electromigration, Simulation of Electromigration in Thin-Film Diffusion Barriers by the Transmission Line Matrix Method
a.481
a.481
Stress Distribution and Mass Transport along Grain Boundaries during Steady-State Electromigration
a.482
a.482
Point Defects, Thermodynamics of Vacancy Formation in Face-Centered Cubic Metals
a.483
a.483
Extended Vacancy-Vacancy Liquid Model
a.484
a.484
Trapping of Point Defects in Alloys due to Short-Range Order
a.485
a.485
X-Ray Triple-Crystal Diffractometry of Defects in Epitaxial Layers
a.486
a.486
Simple Approach to the Calculation of Surface Defect Energies in Transition Metals
a.487
a.487
Defect Profiling in Elemental and Multi-Layer Systems - Correlations of Fitted Defect Concentrations with Positron Implantation Profiles
a.488
a.488
Defect Profiling in Multi-Layered Systems using Mean-Depth Scaling
a.489
a.489
Trapping of Point Defects in Alloys due to Short-Range Order
Page: A485