Planar Defects, Are Nanophase Grain Boundaries Anomalous?
a.511
a.511
Optical Properties of Twinning Superlattices in Diamond-Type and Zincblende-Type Semiconductors
a.512
a.512
The Diffraction Patterns of Crystals with Layer Defects
a.513
a.513
Improved X-Ray and Electron Diffraction Methods for Twin Determination in Hexagonal Crystals
a.514
a.514
The Diffraction of X-Rays by Close-Packed Polytypic Crystals Containing Single Stacking Faults - III
a.515
a.515
Deformation Twinning
a.516
a.516
Surface Energy and Stability of Stress-Driven Discommensurate Surface Structures
a.517
a.517
On the Kinetic Behavior and Driving Force of Diffusion-Induced Grain Boundary Migration
a.518
a.518
Irradiation Effects, Determination of Low-Energy Ion Implantation Damage Parameters by using an Ellipsometric Method
a.519
a.519
The Diffraction of X-Rays by Close-Packed Polytypic Crystals Containing Single Stacking Faults - III
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