Abstracts

Stand-off Positions and Non-Uniform Distributions of Misfit Dislocations in Heterophase Systems
a.531

Point Force and Edge Dislocation in an Elliptical Inclusion in an Infinite Medium
a.532

Defect Control in Semiconductors
a.533

Dislocations Within, Without, or at the Interface of Anisotropic Elliptical Inclusions
a.534

Quantification of Partially Recrystallized Polycrystals using Electron Back-Scattering Diffraction
a.535

Disclination Grain Boundary Model with Plastic Deformation by Dislocations
a.536

Kinetic Theory of Continuously Distributed Dislocations
a.537

Three-Dimensional Simulation of Stress Fields Associated with Disordered Finite Dislocation Walls in Face-Centered Cubic Crystals
a.538

Displacements and Stress Fields due to a Sinusoidal Edge Dislocation
a.539

HomeDefect and Diffusion ForumDefect and Diffusion Forum Vols. 136-137Quantification of Partially Recrystallized...

Quantification of Partially Recrystallized Polycrystals using Electron Back-Scattering Diffraction

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