Point Force and Edge Dislocation in an Elliptical Inclusion in an Infinite Medium
a.532
a.532
Defect Control in Semiconductors
a.533
a.533
Dislocations Within, Without, or at the Interface of Anisotropic Elliptical Inclusions
a.534
a.534
Quantification of Partially Recrystallized Polycrystals using Electron Back-Scattering Diffraction
a.535
a.535
Disclination Grain Boundary Model with Plastic Deformation by Dislocations
a.536
a.536
Kinetic Theory of Continuously Distributed Dislocations
a.537
a.537
Three-Dimensional Simulation of Stress Fields Associated with Disordered Finite Dislocation Walls in Face-Centered Cubic Crystals
a.538
a.538
Displacements and Stress Fields due to a Sinusoidal Edge Dislocation
a.539
a.539
Edge Dislocation Interacting with an Elliptical Inclusion Surrounded by an Interfacial Zone
a.540
a.540
Disclination Grain Boundary Model with Plastic Deformation by Dislocations
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