Abstracts

Computer Modelling of the Nucleation of Dislocations in a Uniformly Strained Face-Centered Cubic Crystal
a.561

Simulation of Dislocation Statics by Using Three-Dimensional Field Equations for Dislocation Segments in Anisotropic Media
a.562

Dislocations and Quasi-Periodic Structures
a.563

Elastic Behavior of Screw Dislocations near to Triple Junctions
a.564

Measurement of Dislocation Densities using Residual Electrical Resistivity Methods
a.565

Molecular Dynamics Simulations of the (c+a) Edge Dislocation Core Structure in an Hexagonal Close-Packed Crystal
a.566

Stability of Dislocations in Epitaxially Strained Semiconductor Stripe Films
a.567

Interaction of Threading and Misfit Dislocations in a Strained Epitaxial Layer
a.568

Reduction of Threading Dislocation Densities in Homogeneous Buffer Layers
a.569

HomeDefect and Diffusion ForumDefect and Diffusion Forum Vols. 138-139Measurement of Dislocation Densities using...

Measurement of Dislocation Densities using Residual Electrical Resistivity Methods

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