Elastic Behavior of Screw Dislocations near to Triple Junctions
a.564
a.564
Measurement of Dislocation Densities using Residual Electrical Resistivity Methods
a.565
a.565
Molecular Dynamics Simulations of the (c+a) Edge Dislocation Core Structure in an Hexagonal Close-Packed Crystal
a.566
a.566
Stability of Dislocations in Epitaxially Strained Semiconductor Stripe Films
a.567
a.567
Interaction of Threading and Misfit Dislocations in a Strained Epitaxial Layer
a.568
a.568
Reduction of Threading Dislocation Densities in Homogeneous Buffer Layers
a.569
a.569
Pseudo-Moiré Dislocations in X-ray Diffraction Topography
a.570
a.570
Atomistic Computation of the Image Force on a Dislocation in a Bicrystal
a.571
a.571
Dislocation Contrast Imaged by Weak Reflections, and the Complete Determination of the Burgers Vector
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a.572
Interaction of Threading and Misfit Dislocations in a Strained Epitaxial Layer
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