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HomeDefect and Diffusion ForumDefect and Diffusion Forum Vols. 171-172

Defect and Diffusion Forum Vols. 171-172

DOI:

https://doi.org/10.4028/www.scientific.net/DDF.171-172

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Table of Contents

Abstract Title Page

Si/SiO₂: Interface Defects

535

Si/SiO₂: Interface Defects

536

Si/SiO₂: Interface Defects

537

Si/SiO₂: Interface Defects

538

Si/SiO₂: Point Defects

539

SiC: H Diffusion and Ion Implantation

540

SiC: Electron Irradiation, Ion Implantation, Point Defects and Defect Annealing

541

SiC: Electron Irradiation and Point Defects

542

SiC: Electron Irradiation and Point Defects

543

SiC: Electron Irradiation, Point Defects, and Defect Annealing

544