Si3N4/Si: Interface Defects
a.279
a.279
TaN: Cu Grain Boundary Diffusion
a.280
a.280
WSiN: Cu Diffusion
a.281
a.281
Ag2O-TeO2-AgI: Ionic Conduction
a.282
a.282
Al2BeO4, (Ga,Sc)5Gd3O12: Dislocations
a.283
a.283
Al4Bi2O: Ionic Conduction and Point Defects
a.284
a.284
Al2O3: Cu, Fe, O Diffusion and Ion Implantation
a.285
a.285
Al2O3: H Diffusion and Point Defects
a.286
a.286
Al2O3: O Diffusion and Point Defects
a.287
a.287
Al2BeO4, (Ga,Sc)5Gd3O12: Dislocations
Page: A283