Line Defects Separating Distinct Interfacial Structures
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a.655
Characterisation of Interfacial Defects using High Resolution Electron Microscopy
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a.656
Misfit Dislocation Generation from Threading Dislocations
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a.657
Stress Relaxation and Misfit Dislocation Nucleation in Growth of Misfitting Films
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a.658
Hagen-Strunk Multiplication Mechanism for Misfit Dislocations
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a.659
Multiplication Mechanisms in Low-Misfit Strained Epitaxial Layers
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a.660
Kinetics of Strain Relaxation through Misfit Dislocation Formation
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a.661
Misfit Strain and Misfit Dislocations in Lattice-Mismatched Epitaxial Layers
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a.662
Misfit Dislocations in Hetero-Epitaxial Growth, and Critical Thickness
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a.663
Hagen-Strunk Multiplication Mechanism for Misfit Dislocations
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