Dislocations Within, Without, or at the Interface of Anisotropic Elliptical Inclusions
a.652
a.652
Intrinsic Ductility Criterion for Interfaces in Solids
a.653
a.653
Basic Configurations of Interfacial and Junction Defects
a.654
a.654
Line Defects Separating Distinct Interfacial Structures
a.655
a.655
Characterisation of Interfacial Defects using High Resolution Electron Microscopy
a.656
a.656
Misfit Dislocation Generation from Threading Dislocations
a.657
a.657
Stress Relaxation and Misfit Dislocation Nucleation in Growth of Misfitting Films
a.658
a.658
Hagen-Strunk Multiplication Mechanism for Misfit Dislocations
a.659
a.659
Multiplication Mechanisms in Low-Misfit Strained Epitaxial Layers
a.660
a.660
Characterisation of Interfacial Defects using High Resolution Electron Microscopy
Page: A656