Excess Stress and the Stability of Buried Strained Heterostructures
a.690
a.690
Dislocation Model for the Relaxation of Strained Single Heterostructures
a.691
a.691
Nucleation of Dislocation Loops in Strained Epitaxial Layer
a.692
a.692
Dynamics of Epitaxial Dislocation Arrays
a.693
a.693
Critical Thicknesses of Epitaxial Layers and Zero-Energy Criterion for Half-Loops
a.694
a.694
Stability of Dislocations in Epitaxially Strained Semiconductor Stripe Films
a.695
a.695
Coherent and Dislocated Island Morphologies in Strained Epitaxial Systems
a.696
a.696
Strain Relaxation in Compositionally Graded Epitaxial Layers
a.697
a.697
Critical Thickness for a Strained Compliant Substrate/Epitaxial Film System
a.698
a.698
Critical Thicknesses of Epitaxial Layers and Zero-Energy Criterion for Half-Loops
Page: A694