Critical Thicknesses of Epitaxial Layers and Zero-Energy Criterion for Half-Loops
a.694
a.694
Stability of Dislocations in Epitaxially Strained Semiconductor Stripe Films
a.695
a.695
Coherent and Dislocated Island Morphologies in Strained Epitaxial Systems
a.696
a.696
Strain Relaxation in Compositionally Graded Epitaxial Layers
a.697
a.697
Critical Thickness for a Strained Compliant Substrate/Epitaxial Film System
a.698
a.698
Influence of Strain on Semiconductor Thin Film Epitaxy
a.699
a.699
Generation, Equilibrium and Emission at Elastically Misfitting Particles
a.700
a.700
Atomic Dislocation Formation Mechanism
a.701
a.701
Self-Organization of Nanoparticles by Bonded Thin Layers
a.702
a.702
Critical Thickness for a Strained Compliant Substrate/Epitaxial Film System
Page: A698