Abstracts

ZnTeS/GaAs: Al Diffusion
a.737

Dual Phase-Lag Diffusion Model for Thin Film Growth
a.738

Kinetics of Photo-Induced Defect Creation in Amorphous Semiconductors
a.739

Point Defects in III-V Arsenides
a.740

Microscopic Characterization of Defects
a.741

Scanning Tunnelling Microscopy of Defects on Semiconductor Surfaces
a.742

Misfit Dislocation Generation in Epitaxial Thin Films
a.743

Forces between Cavities and Dislocations in Semiconductors
a.744

Formation of Interface Dislocations in a Finite Thickness Epilayer
a.745

HomeDefect and Diffusion ForumDefects and Diffusion in Semiconductors IIIMicroscopic Characterization of Defects

Microscopic Characterization of Defects

Page: A741