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HomeDefect and Diffusion ForumDefect and Diffusion Forum Vols. 194-199Interaction of Point Defects with Extended Defects...

Interaction of Point Defects with Extended Defects in the Si-SiO₂ System during its Formation Process

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Diffusion in Materials DIMAT2000

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Periodical:

Defect and Diffusion Forum (Volumes 194-199)

Pages:

1737-1744

DOI:

https://doi.org/10.4028/www.scientific.net/DDF.194-199.1737

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Online since:

April 2001

Authors:

Daniel Kropman, Tiit Kärner, U. Abru, M. Strik, Ü. Ugaste, E. Mellikov

Keywords:

Electron Spin Resonance, Point Defect, Si-SiO₂

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© 2001 Trans Tech Publications Ltd. All Rights Reserved

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