Mechanical Spectroscopy of Pure and Fe-Doped InP Films on Silicon Cantilevers

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Periodical:

Defect and Diffusion Forum (Volumes 206-207)

Edited by:

D.J. Fisher

Pages:

179-182

DOI:

10.4028/www.scientific.net/DDF.206-207.179

Citation:

F.B. Klose et al., "Mechanical Spectroscopy of Pure and Fe-Doped InP Films on Silicon Cantilevers", Defect and Diffusion Forum, Vols. 206-207, pp. 179-182, 2002

Online since:

July 2002

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$35.00

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