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HomeDefect and Diffusion ForumDefect and Diffusion Forum Vols. 206-207Mechanical Spectroscopy of Pure and Fe-Doped InP...

Mechanical Spectroscopy of Pure and Fe-Doped InP Films on Silicon Cantilevers

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Defects and Diffusion in Ceramics IV

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Periodical:

Defect and Diffusion Forum (Volumes 206-207)

Pages:

179-182

DOI:

https://doi.org/10.4028/www.scientific.net/DDF.206-207.179

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Online since:

July 2002

Authors:

F.B. Klose, U. Harms, Hartmut Neuhäuser, I. Behrens, Andrey Bakin, A. Schlachetzki

Keywords:

Anelastic Properties, Elastic Property, Indium Phosphide, Internal Stress, Mechanical Spectroscopy, Thermal Expansion

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© 2002 Trans Tech Publications Ltd. All Rights Reserved

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