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Abstracts
InN: Dislocations
a.249
InN: Point Defects
a.250
InN: Point Defects
a.251
MoxN: Cu, Si Diffusion
a.252
RuTiN: O Diffusion
a.253
SiNx, SiO2: V Diffusion
a.254
SiON/Si: Interface Defects
a.255
SiON/Si: Interface Defects
a.256
TaN: Diffusion
a.257

RuTiN: O Diffusion

Page: A253

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