Periodic Image Effects in Dislocation Modelling
a.732
a.732
Dislocation-Based versus Generalized-Continuum Approaches to Plastic Slip
a.733
a.733
Dynamic Aging of Dislocations and Deformation of Extrinsic Semiconductors
a.734
a.734
Deformation-Twin Characterization Using Electron Back-Scattering
a.735
a.735
Local Migration of Grain Boundaries in Polycrystalline Materials
a.736
a.736
Kinetic Wetting of a Moving Planar Defect by a New Phase
a.737
a.737
Grain-Boundary Interfaces and Void Interaction in Porous Aggregates
a.738
a.738
Changes in Grain Boundary Misorientation Caused by Dislocation Emission
a.739
a.739
Local Melting of Grain Boundaries Containing Impurity Atom Clusters
a.740
a.740
Local Migration of Grain Boundaries in Polycrystalline Materials
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