Dynamic Aging of Dislocations and Deformation of Extrinsic Semiconductors
a.734
a.734
Deformation-Twin Characterization Using Electron Back-Scattering
a.735
a.735
Local Migration of Grain Boundaries in Polycrystalline Materials
a.736
a.736
Kinetic Wetting of a Moving Planar Defect by a New Phase
a.737
a.737
Grain-Boundary Interfaces and Void Interaction in Porous Aggregates
a.738
a.738
Changes in Grain Boundary Misorientation Caused by Dislocation Emission
a.739
a.739
Local Melting of Grain Boundaries Containing Impurity Atom Clusters
a.740
a.740
Stacking Faults and the Non-Equilibrium fcc → 18R1 Transformation
a.741
a.741
Grain Boundary Sliding and Deformation in Nanocrystalline Materials
a.742
a.742
Grain-Boundary Interfaces and Void Interaction in Porous Aggregates
Page: A738