Inverse T-Sample Method of Determination of the Interdiffusion Coefficients in the Cu-Ni-Sn System

Abstract:

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A method of the determining of the mutual diffusion coefficients in ternary intermediate phases is suggested. Methodology for determination of the interdiffusion coefficients of phases formed in a ternary diffusion couple in T-sample configuration is presented. The method requires only one annealing of the T-sample and makes it possible to calculate the matrix of the diffusion coefficients in the (CuNi)6Sn5 and Cu3Sn ternary intermediate phases under low temperature. The concentration profiles and electron micrograph of the diffusion zone was obtained in the ternary Cu-Ni-Sn system annealed for 64 hours under 200°C. Phase competition in this ternary system with special configuration of T-sample leads to lateral diffusion of Cu, to formation (CuNi)6Sn5 compound between Ni-Sn side and to suppression of other NixSny intermediate phases.

Info:

Periodical:

Defect and Diffusion Forum (Volumes 237-240)

Edited by:

M. Danielewski, R. Filipek, R. Kozubski, W. Kucza, P. Zieba, Z. Zurek

Pages:

224-229

DOI:

10.4028/www.scientific.net/DDF.237-240.224

Citation:

Y.A. Lyashenko and V.V. Bogdanov, "Inverse T-Sample Method of Determination of the Interdiffusion Coefficients in the Cu-Ni-Sn System", Defect and Diffusion Forum, Vols. 237-240, pp. 224-229, 2005

Online since:

April 2005

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Price:

$35.00

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