Inverse T-Sample Method of Determination of the Interdiffusion Coefficients in the Cu-Ni-Sn System

Yu.A. Lyashenko; V.V. Bogdanov

doi:10.4028/www.scientific.net/DDF.237-240.224

Paper Titles

A Diffusion-Effusion Database for the Optimization of Radioactive Beams
p.201

Approximate Solutions of Grain Boundary Diffusion in Thin Films in the B₂ Regime
p.206

Kinetics Lecture Modules
p.212

Software for Simulation of Diffusion Process in Polycrystalline Material
p.219

Inverse T-Sample Method of Determination of the Interdiffusion Coefficients in the Cu-Ni-Sn System
p.224

Analyzing Linear Multicomponent Diffusion Phenomena
p.230

Influence of Platinum and Palladium on Diffusion in β-NiAl Phase
p.238

Activation Energies from Sampling Simulations of Diffusion Paths
p.244

Modelling of Interdiffusion and Reactions at the Boundary; Initial-Value Problem of Interdiffusion in the Open System
p.250

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Inverse T-Sample Method of Determination of the Interdiffusion Coefficients in the Cu-Ni-Sn System

Abstract:

A method of the determining of the mutual diffusion coefficients in ternary intermediate phases is suggested. Methodology for determination of the interdiffusion coefficients of phases formed in a ternary diffusion couple in T-sample configuration is presented. The method requires only one annealing of the T-sample and makes it possible to calculate the matrix of the diffusion coefficients in the (CuNi)6Sn5 and Cu3Sn ternary intermediate phases under low temperature. The concentration profiles and electron micrograph of the diffusion zone was obtained in the ternary Cu-Ni-Sn system annealed for 64 hours under 200°C. Phase competition in this ternary system with special configuration of T-sample leads to lateral diffusion of Cu, to formation (CuNi)6Sn5 compound between Ni-Sn side and to suppression of other NixSny intermediate phases.