Interpretation of a Fractional Diffusion Equation for Systems with Trapping
a.471
a.471
Effect of External Field on Activation Barrier to Surface Diffusion
a.472
a.472
Coulomb Divergence in Super-Cell Calculations for Charged Point Defects
a.473
a.473
Defect Control in Advanced High-Mobility Substrates
a.474
a.474
Defect Enhancement using Schlieren Processing
a.475
a.475
Defect States in Two-Dimensional Antidot Lattices
a.476
a.476
Modeling Charged Defects, Diffusion and Activation Mechanisms
a.477
a.477
Electro-Optical Detection of Defect Positions in Semiconductors
a.478
a.478
Control of Defect Concentrations through Adsorption
a.479
a.479
Defect Enhancement using Schlieren Processing
Page: A475