Electro-Optical Detection of Defect Positions in Semiconductors
a.478
a.478
Control of Defect Concentrations through Adsorption
a.479
a.479
Interstitial Oxygen-Related Defects in Trench Metal-Oxide-Semiconductor
a.480
a.480
Simulation of Dislocation Dynamics in Thin Films
a.481
a.481
Dislocation Formation from a Surface Step
a.482
a.482
Island Size Distribution under Conditions of Dislocation-Surface Diffusion
a.483
a.483
Light Scattering by Dislocations in Group-III Nitrides
a.484
a.484
Misfit Dislocation Dipoles in Anisotropic Epitaxial Films
a.485
a.485
Modulated Effect Introduced into Quantum Dot Growth by a Dislocation
a.486
a.486
Dislocation Formation from a Surface Step
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