Diffusion in Isotope Heterostructures Investigated by Neutron Reflectometry

Erwin Hüger; Jochen Stahn; Udo Geckle; Michael Bruns; Harald Schmidt

doi:10.4028/www.scientific.net/DDF.289-292.697

Paper Titles

Composition Effect on Shrinkage of Hollow Binary Alloy Nanospheres
p.665

Shrinkage of Hollow Nanoparticles of Oxides of Cu and Ni at High Temperatures
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Essay on Techniques & Physics of Some Diffusion-Controlled Processes in Materials: Relevance to Nanofabrication Applications
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Impact of Carbon on the Diffusion of Donor Atoms in Germanium
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Diffusion in Isotope Heterostructures Investigated by Neutron Reflectometry
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Atomic Diffusion and its Relation to Thermodynamic Forces in Al-Ni Melts
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Solute Diffusion in Grain Boundaries – Outside the Scope of Fisher Model
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Concentration Characteristics of Diffusion-Induced Recrystallization
p.719

Jump Frequencies of Cd Tracer Atoms in L1₂ Lanthanide Gallides
p.725

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Diffusion in Isotope Heterostructures Investigated by Neutron Reflectometry

Abstract:

Studies of self-diffusion in solids are presented, which are based on neutron reflectometry. For the application of this technique the samples under investigation are prepared in form of isotope heterostructures. These are nanometer sized thin films, which are chemically completely homogenous, but isotope modulated. Using this method, diffusion lengths in the order of 1 nm and below can be detected which allows to determine ultra low diffusivities in the order of 10-25 m2/s. For the model system amorphous silicon nitride we demonstrate how the structure of the isotope hetrostructures (triple layers or multilayers) influences the efficiency of diffusivity determination.