Charged Basal Stacking Fault Scattering in Nitride Semiconductors
a.273
a.273
Probability Density of Stacking Faults in Austenite
a.274
a.274
Phase-Field Model for Deformation Twinning
a.275
a.275
Linear Instability and Initiation of Motion of a Twin Plane Under Load
a.276
a.276
Deformation Slip and Twinning in Semiconductors
a.277
a.277
Dynamic Model of the Formation of Twinned Martensite Crystals II
a.278
a.278
Formation of Twinned Martensite Crystals I
a.279
a.279
Three-Dimensional Characterization of Multiply-Twinned Nanoparticles
a.280
a.280
Twin Boundaries in Nanowires
a.281
a.281
Deformation Slip and Twinning in Semiconductors
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