Correction Method for the X-Ray Diffraction Data Obtained by Thin Film Diffractometer

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Periodical:

Defect and Diffusion Forum (Volumes 53-54)

Edited by:

R.A. Weeks and D.L. Kinser

Pages:

439-444

Citation:

I. Yasui and T. Nanba, "Correction Method for the X-Ray Diffraction Data Obtained by Thin Film Diffractometer", Defect and Diffusion Forum, Vols. 53-54, pp. 439-444, 1987

Online since:

January 1987

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Price:

$38.00

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