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HomeDefect and Diffusion ForumDefect and Diffusion Forum Vols. 95-98Application of Analytical Electron Microscopy to...

Application of Analytical Electron Microscopy to Diffusivity Measurement in Ni-Al System

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Diffusion in Materials - DIMAT 1992

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Periodical:

Defect and Diffusion Forum (Volumes 95-98)

Pages:

579-586

DOI:

https://doi.org/10.4028/www.scientific.net/DDF.95-98.579

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Cite this paper

Online since:

January 1993

Authors:

M. Watanabe, Z. Horita, Takayoshi Fujinami, T. Sano, Minoru Nemoto

Keywords:

Analytical Electron Microscopy, Diffusion Couple, Electron Probe Microanalysis, Interdiffusivity, Nickel-Based Alloy

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© 1993 Trans Tech Publications Ltd. All Rights Reserved

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