Comparative Characterisation of CNS/Epoxy and BN/Epoxy Nanodielectrics Using Electrical Tree PD Measurements and Atomic Force Microscopy

Abstract:

This paper contributes to the body of knowledge on the efforts to develop nanodielectrics as the next generation of insulation material. The time-to-failure under electrical tree-induced degradation of 1.09-1.35 vol.% hexagonal BN/Epoxy was found to be 3 times longer than in clean epoxy. For 0.31-0.33 vol.% CNS/Epoxy the time-to-failure was 24 times longer than the clean epoxy. The electrical treeing partial discharge behaviour in the BN/Epoxy and CNS/Epoxy showed distinct time-evolution characteristics different from those in the clean epoxy. The improved electrical tree endurance in BN/Epoxy relative to the clean epoxy can be attributed to increased mechanical stiffness. The superiority of the CNS/Epoxy as a nanodielectric is notable. The effect is suggested to be due to the electron affinity properties of the carbon nanospheres at appropriate dispersion levels.

• Periodical: International Journal of Engineering Research in Africa (Volume 48)
• Pages: 24-37
• DOI: https://doi.org/10.4028/www.scientific.net/JERA.48.24
• Online since: May 2020
• Authors: Andrew M. Hank*, Cuthbert Nyamupangedengu, Bridget Mutuma, Hu Li, Neil John Coville, Klaus Leifer, Iakovos Sigalas
• Keywords: Atomic Force Microscopy, Boron Nitride, Carbon Nanospheres, Electrical Trees, Partial Discharge Measurements

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