Young Modulus Measurement of Nanostructured Metallic Thin Films

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Edited by:

C.S. Kiminami, C. Bolfarini and W.J. Botta F.

Pages:

758-762

DOI:

10.4028/www.scientific.net/JMNM.20-21.758

Citation:

A.R. Vaz et al., "Young Modulus Measurement of Nanostructured Metallic Thin Films", Journal of Metastable and Nanocrystalline Materials, Vols. 20-21, pp. 758-762, 2004

Online since:

July 2004

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$35.00

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