Paper Titles

Properties of PEO-LiClO₄ Electrolytes Prepared by Non-Equilibrium Processing
p.739

Magnetic Properties and Stability of Magnetically Soft Nanomaterials for High-Temperature Applications
p.747

Adherence Measurements of Nanodiamond Thin Films Grown on Ti6Al4V Alloy
p.753

Young Modulus Measurement of Nanostructured Metallic Thin Films
p.758

Finite Element Analysis on the Effect of Indenter Diameter and Load on the Contact Stresses during Indentation of Coated Systems
p.763

Influence of the Geometry on the Structural Characteristics of Granular and Amorphous Microwires
p.769

Measurement of Electrical Resistivity of Nanostructured Platinum Thin Films and Quantum Mechanical Estimates
p.775

Study of Corrosion Resistance of FeNbCuSiB Alloys with Mo Addition
p.781

Influence of Potassium Sodium Tartrate on the Corrosion Resistance of Electroplated Amorphous Fe-Cr-P Based Alloys
p.787

HomeJournal of Metastable and Nanocrystalline...Journal of Metastable and Nanocrystalline...Influence of the Geometry on the Structural...

Influence of the Geometry on the Structural Characteristics of Granular and Amorphous Microwires

Article Preview

Abstract:

You might also be interested in these eBooks

Metastable, Mechanically Alloyed and Nanocrystalline Materials 2003

Info:

Periodical:

Journal of Metastable and Nanocrystalline Materials (Volumes 20-21)

Pages:

769-774

DOI:

https://doi.org/10.4028/www.scientific.net/JMNM.20-21.769

Citation:

Cite this paper

Online since:

July 2004

Authors:

J.J. del Val, J. González, A. Zukhov

Keywords:

Amorphous Microwires, Glass Coated Microwires, Granular Microwires, Metastable Nanocrystalline Phases, Structural Correlations, X-Ray Diffraction (XRD)

Export:

RIS, BibTeX

Price:

Permissions CCC:

Request Permissions

Permissions PLS:

Request Permissions

Сopyright:

© 2004 Trans Tech Publications Ltd. All Rights Reserved

Share:

Citation:

[1] K. Mohri, T. Uchiyama, L. P. Shen, C. M. Cai and L. V. Panina: Sensors and Actuators A, Vol. 91 (2001), p.85.

[2] P. Allia, M. Knobel, P. Tiberto and F. Vinai: Phys. Rev. B, Vol. 52 (1995), p.15398.

[3] M. Vazquez and A. Zukhov: J. Magn. Magn. Mat., Vol. 160 (1996), p.223.

[4] G. F. Taylor, Phys. Rev., Vol. 23 (1924), p.665. A. V. Ulitovsky, I. M. Maianski and A. I. Avramenco: Patent Nº 128-427 (USSR), 15. 05. 60, Bull 10, p.14.

[5] H. Chiriac and A. Ovari: Progr. Mat. Sci., Vol. 40 (1997), p.333.

[6] J. J. del Val, J. Gonzalez and A. Zukhov: Physica B Cond. Matter, Vol. 299 (2001), p.242.

[7] J. J. del Val, A. Zukhov and J. Gonzalez: J. Magn. Magn. Mat., Vol. 249 (2002), p.126.

[8] S. A. Baranov, V. N. Berzhanski, S. K. Kotov, V. S. Larin and A. V. Torcunov: Phys. Met. Metall., Vol. 67 (1989), p.73.

[9] Powder Diffraction File, Inorganic Phases (International Centre for Diffraction Data, JCPDS, U. S. A. 1985).

[10] R. Jenkins and R. L. Snyder: Introduction to X-ray Powder Diffractometry (Wiley, U. S. A. 1996).

[11] H. P. Klug and L. E. Alexander: X-ray Diffraction Procedures for Polycrystalline and Amorphous Materials (Wiley, U. S. A. 1974).