Influence of Annealing Temperature on Structural, Morphological, Optical and Electrical Properties of Sol-Gel SnO₂ Thin Films

Abstract:

SnO₂ thin films were prepared on glass substrates by sol-gel spin coating method using stannous chloride dihydrate and ethyl alcohol absolute as raw materials at annealing temperature 450-550 °C. The crystal phase was measured by X-ray diffraction (XRD) and showed tetragonal rutile structure with a preferential orientation of (110). Atomic force microscope (AFM) and Scanning Electron Microscope (SEM) images revealed the homogeneous grains distribution, and SEM images showed the obvious rectangular objects corresponding to tetragonal structure. Optical properties were observed by the transmittance in ultraviolet-visible (UV-Vis) region and optical energy gap, which revealed the transmittance over 75% and energy gap between 3.84 eV and 3.89 eV. Finally, I-V characteristics were tested to research electrical properties, and found the gradual non-linear property and the increase of resistance.

• Periodical: Journal of Nano Research (Volume 52)
• Pages: 15-20
• DOI: https://doi.org/10.4028/www.scientific.net/JNanoR.52.15
• Online since: May 2018
• Authors: Ji Tao Li, Ding Yu Yang*, Xing Hua Zhu, Xu Li, Shu Qi Chen, Yu Qi Zhao
• Keywords: Annealing Temperature, Electrical Properties, Morphology, Optical Properties, SnO₂ Thin Films, Structure

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