Positron Annihilation Study of Defects and Microheterogeneity of Chalcogenide Glassy Semiconductors

Abstract:

Article Preview

Info:

Periodical:

Key Engineering Materials (Volumes 13-15)

Edited by:

A.K. Bhatnagar

Pages:

639-640

DOI:

10.4028/www.scientific.net/KEM.13-15.639

Citation:

V. P. Shantarovich and B.V. Kobrin, "Positron Annihilation Study of Defects and Microheterogeneity of Chalcogenide Glassy Semiconductors", Key Engineering Materials, Vols. 13-15, pp. 639-640, 1987

Online since:

January 1987

Export:

Price:

$35.00

In order to see related information, you need to Login.