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Positron Annihilation Study of Defects and Microheterogeneity of Chalcogenide Glassy Semiconductors
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Spin Dynamics in Randomized Spin Systems
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HomeKey Engineering MaterialsKey Engineering Materials Vols. 13-15Positron Annihilation Study of Defects and...

Positron Annihilation Study of Defects and Microheterogeneity of Chalcogenide Glassy Semiconductors

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Amorphous Metals and Semiconductors

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Periodical:

Key Engineering Materials (Volumes 13-15)

Pages:

639-640

DOI:

https://doi.org/10.4028/www.scientific.net/KEM.13-15.639

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Online since:

January 1987

Authors:

Victor P. Shantarovich, B.V. Kobrin

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© 1987 Trans Tech Publications Ltd. All Rights Reserved

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