Observation of Different Interfaces in Silicon Nitride by HRTEM. Influence of the Microstructure on the Creep Properties.

Abstract:

Article Preview

Info:

Periodical:

Key Engineering Materials (Volumes 132-136)

Main Theme:

Edited by:

P. Abelard, J. Baxter, D. Bortzmeyer et al.

Pages:

559-562

DOI:

10.4028/www.scientific.net/KEM.132-136.559

Citation:

G. Bernard-Granger et al., "Observation of Different Interfaces in Silicon Nitride by HRTEM. Influence of the Microstructure on the Creep Properties.", Key Engineering Materials, Vols. 132-136, pp. 559-562, 1997

Online since:

April 1997

Export:

Price:

$35.00

In order to see related information, you need to Login.