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HomeKey Engineering MaterialsKey Engineering Materials Vols. 132-136Observation of Different Interfaces in Silicon...

Observation of Different Interfaces in Silicon Nitride by HRTEM. Influence of the Microstructure on the Creep Properties.

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Euro Ceramics V

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Periodical:

Key Engineering Materials (Volumes 132-136)

Pages:

559-562

DOI:

https://doi.org/10.4028/www.scientific.net/KEM.132-136.559

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Online since:

April 1997

Authors:

Guillaume Bernard-Granger, Bernard Calès, Richard Duclos, Jacques Crampon

Keywords:

Creep, High Resolution Transmission Electron Microscopy

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© 1997 Trans Tech Publications Ltd. All Rights Reserved

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