'Photothermal Characterisation of Microelectronics Ceramics at Various Scales'

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Periodical:

Key Engineering Materials (Volumes 132-136)

Main Theme:

Edited by:

P. Abelard, J. Baxter, D. Bortzmeyer et al.

Pages:

663-666

DOI:

10.4028/www.scientific.net/KEM.132-136.663

Citation:

D. Fournier et al., "'Photothermal Characterisation of Microelectronics Ceramics at Various Scales'", Key Engineering Materials, Vols. 132-136, pp. 663-666, 1997

Online since:

April 1997

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$35.00

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