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HomeKey Engineering MaterialsKey Engineering Materials Vols. 145-149Emission of an Edge Dislocation from a...

Emission of an Edge Dislocation from a Thin-Film-Covered Crack

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Fracture and Strength of Solids III

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Periodical:

Key Engineering Materials (Volumes 145-149)

Pages:

161-166

DOI:

https://doi.org/10.4028/www.scientific.net/KEM.145-149.161

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Online since:

October 1997

Authors:

C.-F. Qian, Tong Yi Zhang, Pin Tong

Keywords:

Edge Dislocation Emission, Fracture, Stress Corrosion Cracking (SCC), Stress Intensity Factor (SIF), Thin Film

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© 1998 Trans Tech Publications Ltd. All Rights Reserved

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