Evaluation of T Stress for a Finite Internally Cracked Plate by Using EEVM Method

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Periodical:

Key Engineering Materials (Volumes 145-149)

Edited by:

P. Tong, T.Y. Zhang and J.K. Kim

Pages:

47-50

DOI:

10.4028/www.scientific.net/KEM.145-149.47

Citation:

Y. H. Chen et al., "Evaluation of T Stress for a Finite Internally Cracked Plate by Using EEVM Method", Key Engineering Materials, Vols. 145-149, pp. 47-50, 1998

Online since:

October 1997

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Price:

$35.00

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