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Sintering Reactions of Mixtures of Υ - α'-SiAION and α -Si₃N₄
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Densification and Properties of Clay Derived O'-Sialon Powder
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Electron Microscopy and Microanalysis of Advanced Ceramics
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Layered Silicon Nitride Ceramics with Improved Flaw Tolerance
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Tailoring the Microstructure of Duplex Si₃N₄-Based Ceramics by Pre- and Post-Sintering Heat-Treatment
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Measurement of Strength of Ceramic Materials Using a Miniaturized Bending Method
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HomeKey Engineering MaterialsKey Engineering Materials Vols. 159-160Electron Microscopy and Microanalysis of Advanced...

Electron Microscopy and Microanalysis of Advanced Ceramics

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Periodical:

Key Engineering Materials (Volumes 159-160)

Pages:

235-244

DOI:

https://doi.org/10.4028/www.scientific.net/KEM.159-160.235

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Online since:

May 1998

Authors:

Gregory P. Thomes, M. Gopal

Keywords:

Ceramic, Composite, Electron Microscopy, Interface, Joining

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© 1999 Trans Tech Publications Ltd. All Rights Reserved

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