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HomeKey Engineering MaterialsKey Engineering Materials Vols. 175-176Young's Modulus Measurement of Silicon Nitride...

Young's Modulus Measurement of Silicon Nitride Ceramics by Indentation Methods

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Periodical:

Key Engineering Materials (Volumes 175-176)

Pages:

335-0

DOI:

https://doi.org/10.4028/www.scientific.net/KEM.175-176.335

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Online since:

October 1999

Authors:

Emőke Rudnayová, Pavol Hvizdoš, Péter Arató, Ladislav Pešek

Keywords:

Depth Sensing Indentation Methods, Sprigg's Equation, Ultrasonic Contact Impedance Method, Young's Modulus Measurement

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© 2000 Trans Tech Publications Ltd. All Rights Reserved

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