In-Situ High Temperature Study of Ceramics and Ceramic Ultra-Thin Films Using a X-Ray Diffractometer with a Parabolic Multilayer Mirror

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Periodical:

Key Engineering Materials (Volumes 206-213)

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Edited by:

C. Kermel, V. Lardot, D. Libert and I. Urbain

Pages:

775-778

Citation:

G. Roebben et al., "In-Situ High Temperature Study of Ceramics and Ceramic Ultra-Thin Films Using a X-Ray Diffractometer with a Parabolic Multilayer Mirror", Key Engineering Materials, Vols. 206-213, pp. 775-778, 2002

Online since:

December 2001

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$38.00

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