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HomeKey Engineering MaterialsKey Engineering Materials Vols. 206-213In-Situ High Temperature Study of Ceramics and...

In-Situ High Temperature Study of Ceramics and Ceramic Ultra-Thin Films Using a X-Ray Diffractometer with a Parabolic Multilayer Mirror

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Euro Ceramics VII

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Periodical:

Key Engineering Materials (Volumes 206-213)

Pages:

775-778

DOI:

https://doi.org/10.4028/www.scientific.net/KEM.206-213.775

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Online since:

December 2001

Authors:

Gert Roebben, Chao Zhao, Ren-Guan Duan, Jef Vleugels, Marc Heyns, Omer Van der Biest

Keywords:

Crystallization, High Temperature X-Ray Diffraction, Intergranular Phase, Parabolic Multilayer X-Ray Mirror, Thermal Expansion, Thin Film

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© 2002 Trans Tech Publications Ltd. All Rights Reserved

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