In-Situ High Temperature Study of Ceramics and Ceramic Ultra-Thin Films Using a X-Ray Diffractometer with a Parabolic Multilayer Mirror

Abstract:

Article Preview

Info:

Periodical:

Key Engineering Materials (Volumes 206-213)

Main Theme:

Edited by:

C. Kermel, V. Lardot, D. Libert and I. Urbain

Pages:

775-778

DOI:

10.4028/www.scientific.net/KEM.206-213.775

Citation:

G. Roebben et al., "In-Situ High Temperature Study of Ceramics and Ceramic Ultra-Thin Films Using a X-Ray Diffractometer with a Parabolic Multilayer Mirror", Key Engineering Materials, Vols. 206-213, pp. 775-778, 2002

Online since:

December 2001

Export:

Price:

$35.00

In order to see related information, you need to Login.