Film Thickness Dependence of Structural and Dielectric Properties of Pb(Mg1/3Nb2/3)O3/BaTiO3/Pt/Ti/SiO2/Si

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Periodical:

Key Engineering Materials (Volumes 228-229)

Edited by:

T. Kimura, K. Koumoto, T. Takenaka, S. Fujitsu, K. Shinozaki

Pages:

87-92

DOI:

10.4028/www.scientific.net/KEM.228-229.87

Citation:

C. H. Chen et al., "Film Thickness Dependence of Structural and Dielectric Properties of Pb(Mg1/3Nb2/3)O3/BaTiO3/Pt/Ti/SiO2/Si", Key Engineering Materials, Vols. 228-229, pp. 87-92, 2002

Online since:

September 2002

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$35.00

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