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HomeKey Engineering MaterialsKey Engineering Materials Vols. 228-229Film Thickness Dependence of Structural and...

Film Thickness Dependence of Structural and Dielectric Properties of Pb(Mg_1/3Nb_2/3)O₃/BaTiO₃/Pt/Ti/SiO₂/Si

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Asian Ceramic Science for Electronics II and Electroceramics in Japan V

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Periodical:

Key Engineering Materials (Volumes 228-229)

Pages:

87-92

DOI:

https://doi.org/10.4028/www.scientific.net/KEM.228-229.87

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Online since:

September 2002

Authors:

Chun Hua Chen, Naoki Wakiya, Kazuo Shinozaki, Nobuyasu Mizutani

Keywords:

Grazing X-Ray Diffraction, PLD, Thermal Expansion

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© 2002 Trans Tech Publications Ltd. All Rights Reserved

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