Film Thickness Dependence of Structural and Dielectric Properties of Pb(Mg1/3Nb2/3)O3/BaTiO3/Pt/Ti/SiO2/Si

Abstract:

Article Preview

Info:

Periodical:

Key Engineering Materials (Volumes 228-229)

Edited by:

T. Kimura, K. Koumoto, T. Takenaka, S. Fujitsu, K. Shinozaki

Pages:

87-92

Citation:

C. H. Chen et al., "Film Thickness Dependence of Structural and Dielectric Properties of Pb(Mg1/3Nb2/3)O3/BaTiO3/Pt/Ti/SiO2/Si", Key Engineering Materials, Vols. 228-229, pp. 87-92, 2002

Online since:

September 2002

Export:

Price:

$38.00

Fetching data from Crossref.
This may take some time to load.