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HomeKey Engineering MaterialsKey Engineering Materials Vols. 228-229Preparation and Characterization of...

Preparation and Characterization of Layer-Structured Perovskite Ca_XBi_4-XTi₃O_12-X/2 (X = 1, 2) Thin Films

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Asian Ceramic Science for Electronics II and Electroceramics in Japan V

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Periodical:

Key Engineering Materials (Volumes 228-229)

Pages:

93-98

DOI:

https://doi.org/10.4028/www.scientific.net/KEM.228-229.93

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Online since:

September 2002

Authors:

Kazumi Kato, Kazuyuki Suzuki, Kaori Nishizawa, Takeshi Miki

Keywords:

A-Site Substitution, Bi-Based Layer-Structured Perovskite, Chemical Solution Deposition CSD, Fatigue Behaviour, Ferroelectric Thin Film, Metal Alkoxides, P-E Hysteresis Properties

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© 2002 Trans Tech Publications Ltd. All Rights Reserved

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