[1]
J. Yan, K. Syoji, T. Kuriyagawa, K. Tanaka and H. Suzuki: Proc. of the ASPE, Vol. 22 (2000), p.66.
Google Scholar
[2]
D. C. OShea: (Wiley, New York 1985).
Google Scholar
[3]
H. Suzuki, T. Kitajima and S. Okuyama: J. Jap. Soc. Prec. Eng., Vol. 65 (1999), p.401.
Google Scholar
[4]
W. B. Lee, C. F. Cheung, W. M. Chiu and T. P. Leung: J. Mater. Proc. Tech., Vol. 99 (2000), p.129.
Google Scholar
[5]
W. S. Blackly and R. O. Scattergood: Prec. Eng., Vol. 13 (1991), p.95.
Google Scholar
[6]
T. Nakasuji, S. Kodera, S. Hara, H. Matsunaga, N. Ikawa and S. Shimada: Ann. CIRP, Vol. 39 (1990), p.89.
DOI: 10.1016/s0007-8506(07)61009-9
Google Scholar
[7]
J. Yan, K. Syoji and T. Kuriyagawa: J. Jap. Soc. Prec. Eng., Vol. 68 (2002), p.561.
Google Scholar
[8]
J. Yan, J. Tamaki, K. Syoji and T. Kuriyagawa: Key Eng. Mater., Vol. 238-239 (2003), p.43.
Google Scholar
[9]
J. Yan, K. Syoji, T. Kuriyagawa and H. Suzuki: J. Mater. Proc. Tech., Vol. 121 (2002), p.363.
Google Scholar
[10]
J. Yan, J. Tamaki, K. Syoji and T. Kuriyagawa: Int. J. Adv. Manuf. Tech., in press. 0.1 - 0.1 0 2000 0 Ra = 6.1 nm Rrms = 7.8 nm Ry = 39.2 nm µm µm Fig. 7 Coross-sectional profile of the finished surface measured by non-contact measuring instrument. 20 µm Fig. 8 Nomarski micrograph of the machined aspherical lens surface
Google Scholar