Time of Flight Diffraction Method Using Laser Ultrasound for Noncontact Flaw Height Measurement

T. Mihara; Y. Otsuka; H. Cho; Kazushi Yamanaka

doi:10.4028/www.scientific.net/KEM.261-263.987

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Multiple Scattering of Elastic Waves in a Fiber-Reinforced Cementitious Composite
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A Fast Shape Inversion Method of Flaws in Materials for Infrastructures
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Time of Flight Diffraction Method Using Laser Ultrasound for Noncontact Flaw Height Measurement
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Grain Boundary Engineering for the Control of Mechanical Properties and Oxidation-Induced Embrittlement in Silicon Carbides
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HomeKey Engineering MaterialsKey Engineering Materials Vols. 261-263Time of Flight Diffraction Method Using Laser...

Time of Flight Diffraction Method Using Laser Ultrasound for Noncontact Flaw Height Measurement

Abstract:

We developed a laser TOFD (Time of flight diffraction) algorithm which utilizes not only longitudinal wave but also shear wave. This algorithm made it possible to obtain accurate flaw depth without knowing the specimen velocity and probe distance previously. We constructed the laser TOFD system and applied it to estimate the slit depth of aluminum alloy plate. Time of flight of lateral wave, flaw tip diffraction waves and mode converted shear wave at flaw tip were used to estimate the slit depth using new algorithm.