Determination of Stability Areas of Yb- and Nd-α-SiAlON Phases Using the Rietveld Method

M. Herrmann; Stefan Holzer; Michael J. Hoffmann

doi:10.4028/www.scientific.net/KEM.264-268.1075

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HomeKey Engineering MaterialsKey Engineering Materials Vols. 264-268Determination of Stability Areas of Yb- and...

Determination of Stability Areas of Yb- and Nd-α-SiAlON Phases Using the Rietveld Method

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Key Engineering Materials (Volumes 264-268)

Pages:

1075-1078

DOI:

https://doi.org/10.4028/www.scientific.net/KEM.264-268.1075

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Online since:

May 2004

Authors:

M. Herrmann, Stefan Holzer, Michael J. Hoffmann

Keywords:

Phase Diagram, Rietveld Analysis, X-Ray Diffraction (XRD), α-Sialon

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