[1]
J. Bill, R.C. Hoffmann, T.M. Fuchs and F. Aldinger: Z. Metallkd. Vol. 93 (2002), p.478.
Google Scholar
[2]
T.P. Niesen and M.R. De Guire: J. Electroceramics Vol. 6 (2001), p.169.
Google Scholar
[3]
J.H. Fendler: Chem. Mater. Vol. 13 (2001), p.3196.
Google Scholar
[4]
J. Liu, A.Y. Kim, L.Q. Wang, B.J. Palmer, Y.L. Chen, P. Bruinsma, B.C. Bunker, G.J. Exarhos, G.L. Graff, P.C. Rieke, G.E. Fryxell, J.W. Virden, B.J. Tarasevich and L.A. Chick: Adv. Coll. Interface Sci. Vol. 69 (1996), p.131.
DOI: 10.1016/s0001-8686(96)00309-0
Google Scholar
[5]
H. Shin, R.J. Collins, M.R. DeGuire, A.H. Heuer and C.N. Sukenik: J. Mater. Res. Vol. 10 (1995), p.692.
Google Scholar
[6]
R.J. Collins, H. Shin, M.R. De Guire, A.H. Heuer and C.N. Sukenik: Appl. Phys. Lett. Vol. 69 (1996), p.785.
Google Scholar
[7]
Z. Xiao, J. Gu, D. Hunag, Z. Lu and Y. Wei: Appl. Surf. Sci. Vol. 125 (1998), p.85.
Google Scholar
[8]
Z. Xiao, L. Su, N. Gu, Z. Lu and Y. Wei: Thin Solid Films Vol. 333 (1998), p.25.
Google Scholar
[9]
T.P. Niesen, J. Bill, F. Aldinger: Chem. Mater. Vol. 13 (2001), p.1552.
Google Scholar
[10]
T.M. Fuchs, R.C. Hoffmann, T.P. Niesen, J. Bill and F. Aldinger: J. Mater. Chem. Vol. 12 (2002), p.1597.
Google Scholar
[11]
Y. Masuda, Y. Jinbo, T. Yonezawa and K. Koumoto: Chem. Mater. Vol. 14 (2002), p.1236.
Google Scholar
[12]
Y. Masuda, T. Sugiyama, H. Lin, W.S. Seo and K. Koumoto: Thin Solid Films Vol. 382 (2001), p.153.
Google Scholar
[13]
K. Koumoto, S. Seo, T. Sugiyama, W.S. Seo and W.J. Dressick: Chem. Mater. Vol. 11 (1999), p.2305.
Google Scholar
[14]
H. Pizem, C.N. Sukenik, U. Sampathkuramaran, A.K. Mc Ilwain and M.R. De Guire: Chem. Mater. Vol. 14 (2002), p.2476.
Google Scholar
[15]
Y. Tang, Y. Liu, U. Sampathkumaran, M.Z. Hu, R. Wang, M.R. De Guire: Solid State Ionics Vol. 151 (2002), p.69.
Google Scholar
[16]
R. Hoffmann, T. Fuchs, T.P. Niesen, J. Bill and F. Aldinger: Surf. Interface Anal. Vol. 34 (2002), p.708.
Google Scholar
[17]
R.C. Hoffmann, S. Jia, J.C. Bartolomé, T.M. Fuchs, J. Bill, P.C.J. Graat and F. Aldinger: J. Eur. Ceram. Soc. (accepted).
Google Scholar
[18]
N. Saito, H. Haneda, T. Sekiguchi, N. Ohashi, I. Sakaguchi and K. Koumoto: Adv. Mater. Vol. 14 (2002), p.418.
Google Scholar
[19]
R.M. Nyffenegger, B. Craft, M. Shaaban, S. Gorer, G. Erley and R.M. Penner: Chem. Mater. Vol. 10 (1998), p.1120.
DOI: 10.1021/cm970718m
Google Scholar
[20]
N. Saito, H. Haneda, W.S. Seo and K. Koumoto: Langmuir Vol. 17 (2001), p.1461.
Google Scholar
[21]
M. Agarwal, M.R. De Guire and A.H. Heuer: J. Am. Ceram. Soc. Vol. 80 (1997), p.2967.
Google Scholar
[22]
Y. Gao, Y. Masuda, T. Yonezawa and K. Koumoto: Chem. Mater. Vol. 14 (2002), p.5006.
Google Scholar
[23]
A.K. Grag, A.K. Tripathi, T.C. Goel, M.M.A. Sekar and C.N. Sukenik: Mat. Sci. Eng. B-Solid Vol. 87 (2001), p.87.
Google Scholar