Paper Titles

Structural Characterization of Bismuth Layered Perovskite Treated with Acids
p.181

Development of LTCC-Alumina Powder
p.185

Microwave Dielectric Property and Crystal Structure of R₂O₃ (R = Rare Earth)-BaO-MO (M = Cu and Zn) System
p.191

Microwave-Millimeterwave Dielectric Materials
p.195

Development of Forsterite with High Q and Zero Temperature Coefficient τ_f for Millimeterwave Dielectric Ceramics
p.199

Microwave Dielectric Homologous Materials ALa₄Ti₄O₁₅(A=Ba,Ca,Sr) with High Q - High Dielectric Constant for Base Station
p.203

Anisotropic Microwave Dielectric Properties of Textured Ba₄ Sm_9.33 Ti₁₈ O₅₄ Ceramics
p.207

Microwave Dielectric Film by Aerosol Deposition Method
p.211

Measurement of Micro-Wave Dielectric Properties of SrTiO₃ Substrate Thin Plates Using Planar Electrodes
p.215

HomeKey Engineering MaterialsKey Engineering Materials Vol. 269Development of Forsterite with High Q and Zero...

Development of Forsterite with High Q and Zero Temperature Coefficient τ_f for Millimeterwave Dielectric Ceramics

Article Preview

Abstract:

You might also be interested in these eBooks

Electroceramics in Japan VII

Info:

Periodical:

Key Engineering Materials (Volume 269)

Pages:

199-202

DOI:

https://doi.org/10.4028/www.scientific.net/KEM.269.199

Citation:

Cite this paper

Online since:

August 2004

Authors:

Tsutomu Tsunooka, Tomonori Sugiyama, Hitoshi Ohsato, Kenichi Kakimoto, Minato Andou, Yutaka Higashida, Hirotsugu Sugiura

Keywords:

Forsterite, Low-Loss Dielectrics, Low-Permittivity Dielectrics, Microwave Dielectrics, Millimeterwave Dielectrics , Quality Factors, Temperature Coefficient τ_f

Export:

RIS, BibTeX

Price:

Permissions CCC:

Request Permissions

Permissions PLS:

Request Permissions

Сopyright:

© 2004 Trans Tech Publications Ltd. All Rights Reserved

Share:

Citation:

[1] Buchanan, R. C., Ed. by Bachanan, R. C., Marcel Dekker, new York and Basel (1996) 1.

[2] Andou, M., Tsunooka, T., Higashida, Y., Sugiura, H. and Ohsato, H., Abstract for Microwave Materials and their Applications, p.141, 1-3 Sept. 2002 York, UK.

[3] Tsunooka, T., Andou, M., Higashida, Y., Sugiura, H. and Ohsato, H., J. Euro. Ceram. Soc., Vol. 23(14), (2003)2573.

[4] Ohsato, H., Tsunooka, T., Andou, M., Ohishi, Y., Miyauchi, Y. and Kakimoto, K., J. Korean Ceram. Soc., Vol. 40, (2003)350. Fig. 5. XRPD patterns of Mg2SiO4 sintered at 1200ºC (a) and 1400 ºC (b) for 2 h.