Paper Titles

Microwave-Millimeterwave Dielectric Materials
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Development of Forsterite with High Q and Zero Temperature Coefficient τ_f for Millimeterwave Dielectric Ceramics
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Microwave Dielectric Homologous Materials ALa₄Ti₄O₁₅(A=Ba,Ca,Sr) with High Q - High Dielectric Constant for Base Station
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Anisotropic Microwave Dielectric Properties of Textured Ba₄ Sm_9.33 Ti₁₈ O₅₄ Ceramics
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Microwave Dielectric Film by Aerosol Deposition Method
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Measurement of Micro-Wave Dielectric Properties of SrTiO₃ Substrate Thin Plates Using Planar Electrodes
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Dielectric Measurement of BaTiO₃-Based Ceramics in RF Region Using Electric Length Calibration Method
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Characteristics of Composite Electromagnetic Wave Absorber Made of Ni-Zn Ferrite and Isolated SiO₂ Particles
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Dielectric Properties and its Frequency Dependence of BaTiO₃ Thin Film Single-Layer Capacitor that is Applicable to Multilayer Structure
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HomeKey Engineering MaterialsKey Engineering Materials Vol. 269Microwave Dielectric Film by Aerosol Deposition...

Microwave Dielectric Film by Aerosol Deposition Method

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Electroceramics in Japan VII

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Periodical:

Key Engineering Materials (Volume 269)

Pages:

211-214

DOI:

https://doi.org/10.4028/www.scientific.net/KEM.269.211

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Online since:

August 2004

Authors:

Yoshihiko Imanaka, Masatoshi Takenouchi, Jun Akedo

Keywords:

20 GHz, Aerosol Deposition (AD) Method, Ba(Zn_1/3Ta_2/3)O₃, LTCC, Microwave Filter, Q Value, Room Temperature

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© 2004 Trans Tech Publications Ltd. All Rights Reserved

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Citation:

[1] J. Akedo and M. Lebedev, Applied. Physics. Letter, 77, 1710 (2000).

[2] J. Akedo and M. Lebedev, Applied. Physics. Letter, 79, 4458 (2001).