Dielectric Properties and its Frequency Dependence of BaTiO3 Thin Film Single-Layer Capacitor that is Applicable to Multilayer Structure

Hirokazu Yokoi; Naoki Wakiya; Kazuo Shinozaki; Nobuyasu Mizutani

doi:10.4028/www.scientific.net/KEM.269.229

Paper Titles

Microwave Dielectric Film by Aerosol Deposition Method
p.211

Measurement of Micro-Wave Dielectric Properties of SrTiO₃ Substrate Thin Plates Using Planar Electrodes
p.215

Dielectric Measurement of BaTiO₃-Based Ceramics in RF Region Using Electric Length Calibration Method
p.219

Characteristics of Composite Electromagnetic Wave Absorber Made of Ni-Zn Ferrite and Isolated SiO₂ Particles
p.223

Dielectric Properties and its Frequency Dependence of BaTiO₃ Thin Film Single-Layer Capacitor that is Applicable to Multilayer Structure
p.229

The Effect of Nb Doping to Control the Oxygen Defect and Improve C-V Properties of PLD Prepared YSZ Thin Film
p.233

AEM Investigation of Interface Structure of Y₂O₃-Ta₂O₅ Co-Doped Zirconia Buffer Layer
p.237

Formation and its Photovoltaic Effect of Layered Ferroelectric Film Structure
p.241

Improvement of Magnetic Properties of (111)-Epitaxial Nickel-Zinc-Ferrite Thin Films Deposited on Si Platform
p.245

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Dielectric Properties and its Frequency Dependence of BaTiO₃ Thin Film Single-Layer Capacitor that is Applicable to Multilayer Structure

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Key Engineering Materials (Volume 269)

Pages:

229-232

DOI:

https://doi.org/10.4028/www.scientific.net/KEM.269.229

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Online since:

August 2004

Authors:

Hirokazu Yokoi, Naoki Wakiya, Kazuo Shinozaki, Nobuyasu Mizutani

Keywords:

Barium Titanate (BT), Dielectric Materials, Multi-Layer Capacitor, RF Magnetron Sputter, Thin Film

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