Dielectric Properties and its Frequency Dependence of BaTiO3 Thin Film Single-Layer Capacitor that is Applicable to Multilayer Structure

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Periodical:

Edited by:

M. Miyayama, T. Takenaka, M. Takata and K. Shinozaki

Pages:

229-232

DOI:

10.4028/www.scientific.net/KEM.269.229

Citation:

H. Yokoi et al., "Dielectric Properties and its Frequency Dependence of BaTiO3 Thin Film Single-Layer Capacitor that is Applicable to Multilayer Structure", Key Engineering Materials, Vol. 269, pp. 229-232, 2004

Online since:

August 2004

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$35.00

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